2.1 Basic Functions and Basis Standards:
The M3 handheld four-probe tester is a multi-purpose and cost-effective measuring instrument that uses the four-probe measurement principle to test the resistivity/block resistance of materials. This instrument is designed in accordance with national standards such as GB/T 1551-2009 "Method for Determining Resistivity of Silicon Single Crystals" and GB/T 1552-1995 "Direct Current Four-Probe Method for Determining Resistivity of Silicon and Germanium Single Crystals", and also refers to the American A.S.T.M standard.
2.2 Supporting Components: The standard configuration consists of two parts: the M-3 main unit and the optional four-probe probe. It can also be equipped with a test bench to be used as a desktop machine.
2.3 Advantages and Characteristics:
1. Aesthetically pleasing and practical: The colorful streamlined handheld panel with anti-slip pads is ergonomically designed. It is suitable for handheld operation in various occasions. It can also be customized into a small travel suitcase packaging for convenient use in the wild or during travel.
2. High precision: Equipped with complete thickness and shape correction functions, ensuring accurate testing. Most of the handheld devices in the industry are simple programs and do not have complete correction functions, making it impossible to correct errors.
3. Wide range: Five extra-wide gears, equivalent to the range of a mid-range desktop computer. Most handheld models in the same industry have two to three gears, with a limited testing range and limited adaptability.
4. Easy operation and stable performance: Parameter setting and function conversion can be achieved by simply touching the digital keyboard, which is simple and eliminates the instability and susceptibility to interference of analog positioners.
5 Manual/Automatic integrated:
6. Beautiful and clear display mode: It is displayed by high-brightness green digital and LED digital meter head, which is not afraid of dark background or strong light in the wild.
It has a long standby and working time (no less than two days), is powered by a large-capacity rechargeable lithium battery, and is environmentally friendly and durable.
2.4 Probe Selection: According to the characteristics of different materials, there are multiple types of probes available for selection. For details, please refer to the "Four-Probe Probe Model Specification Feature Selection Reference Table"
It is equipped with highly wear-resistant tungsten carbide probes, such as the ST2253-F01 type, to test the resistivity/square resistance of hard materials like silicon and other semiconductors, metals, and conductive plastics.
It is equipped with spherical or flat-head gold-plated copper alloy probe probes that do not damage the film, such as the ST2558B-F01 type, which can measure the resistivity/square resistance of conductive films such as metal foil and carbon paper, as well as conductive coating films on substrates such as ceramics, glass or PE films, such as metal coating, spray coating, ITO film, capacitive convolutional film and other materials.
When equipped with dedicated foil-coated probes, such as the ST2558B-F02 model, it can also test the resistivity/square resistance of foil-coated materials on lithium battery electrode sheets, etc.
By changing to the four-terminal test fixture, the body resistance of the resistor can also be measured.
2.5 Test bench options: According to the requirements of different material properties, there are multiple types of test benches available for selection. For details, please refer to the "Reference Table for Model, Specification and Feature Selection of Four-Probe Test Bench"
For testing solid or thin film materials by the four-probe method, the SZT-A type, SZT-B type (electric), or SZT-C type (rapid constant pressure) test bench can be selected.
For testing slender rod materials by the two-probe method, the SZT-K type test bench is selected as an option.
The SZT-G type test bench is selected for the parallel four-knife method test of rubber and plastic materials.
2.6 Scope of Application: Handheld use. The instrument is suitable for testing the electrical conductivity of conductors, semiconductors, and semiconductor-like materials by the four-probe method in semiconductor material factories, device factories, research institutions, and universities.
Iii. Basic Technical Parameters
1. Measurement range and resolution
Electrical resistance: 0.010Ω to 50.00kΩ, resolution: 0.001Ω to 10Ω
Resistivity: 0.010Ω-cm to 20.00kΩ-cm, resolution: 0.001Ω -cm
Block resistance: 0.050Ω/□ to 100.00kΩ/□ Resolution: 0.001Ω to 10 Ω/□
2. Measurable material dimensions
The handheld mode is not limited by the material size, but the addition of a test bench is determined by the optional test bench as follows:
Straight diameter: SZT-A circular test bench direct testing method Φ15 ~ 130mm.
The direct testing method of the SZT-C square test bench is 180mm×180mm.
Length (height) : The direct test method on the test bench is H≤100mm. .
Measurement orientation: Both axial and radial directions are acceptable.
3. Range division and error grade (Extended range in parentheses)
|
Range (Ω-cm/□)
|
2.000
（200.0ｍ）
|
20.00
（2.000ｍ）
|
200.0
（20.00）
|
2.000k
（200.0）
|
20.00k
（2.000k）
|
|
Resistance test range
|
0.010～2.200
|
2.000～22.00
|
20.00～220.0
|
0.200～2.200k
|
2.000～50.00k
|
|
Resistivity/square resistance
|
0.010/0.050～2.200
|
2.000～22.00
|
20.00～220.0
|
0.200～2.200k
|
2.000～20.00k/100.0k
|
|
Basic error
|
±1%FSB±2LSB
|
±2%FSB±2LSB
|
4) Charger working power supply: 220V± 10%, f=50Hz± 4%,PW≤5W, or battery-powered DC3.7V.
5) Dimensions: W×H×L=10cm×3.6cm×21cm
